Top 100 US Patents in Measuring and Testing
section g - physics > measuring; testing > measuring electric variables; measuring magnetic variables
Sorted by IPQ® Score, an objective measure of patent quality. View scores and methodology at PatentRatings.com. You can also view all by publication date instead.
US6671537 (B1), filed
Wed May 31 00:00:00 CDT 1995
, published
Tue Dec 30 00:00:00 CST 2003
- BONUTTI 2003 TRUST A
A method to simulate within an imaging coil normal movements of body parts such as joints, and improve imaging of soft tissue and bony parts as compared to a static system in which images are taken of a joint in only one position. A joint or body parts is...
US4988947 (A), filed
Wed Sep 13 00:00:00 CDT 1989
, published
Tue Jan 29 00:00:00 CST 1991
- UNIV MINNESOTA
Two amplitude/frequency/phase modulated pulses that can achieve 90 DEG plane rotations over large B1 field inhomogeneities are described. The pulses achieve this by use of a "flip" in the direction of the effective B1 field half-way through the pulse, and by...
US4926452 (A), filed
Fri Oct 30 00:00:00 CST 1987
, published
Tue May 15 00:00:00 CDT 1990
- FOUR PI SYSTEMS CORP
A tomographic inspection system wherein the electron beam of a microfocus X-ray tube is deflected in a circular scan pattern onto the tube anode in synchronization with a rotating detector that converts the X-ray shadowgraph into an optical image and derotates...
US5220281 (A), filed
Tue Jan 28 00:00:00 CST 1992
, published
Tue Jun 15 00:00:00 CDT 1993
- TOKYO SHIBAURA ELECTRIC CO
A boundary scan cell is disclosed. Bi-directional input/output terminals are connected to bi-directional input/output terminals of a logic circuit subject to test in order to store test data or a test result in a first latch circuit, the output impedance of...
US6801461 (B2), filed
Mon Dec 17 00:00:00 CST 2001
, published
Tue Oct 05 00:00:00 CDT 2004
- TEXAS INSTRUMENTS INC
An integrated circuit has a built-in self-test (BIST) arrangement (60). The built-in self-test arrangement includes a read only memory (ROM), (140) that stores test algorithm instructions. A ROM logic circuit (410) receives an instruction read from the read...
US5159271 (A), filed
Tue Jul 24 00:00:00 CDT 1990
, published
Tue Oct 27 00:00:00 CST 1992
- COMMISSARIAT ENERGIE ATOMIQUE
Turbine for the analysis of samples by nuclear magnetic resonance. It comprises a rotor (7) having a spherical central core (8), whereof a cavity (9) contains the solid sample to be analyzed. Two conical surfaces are provided on either side of the central core...
US6310484 (B1), filed
Mon Jun 28 00:00:00 CDT 1999
, published
Tue Oct 30 00:00:00 CST 2001
- MICRON TECHNOLOGY INC
An interconnect for testing semiconductor components includes a substrate, and interconnect contacts on the substrate for electrically engaging terminal contacts on the components. The interconnect also includes one or more cavities in the substrate which form...
US6498503 (B2), filed
Mon Dec 04 00:00:00 CST 2000
, published
Tue Dec 24 00:00:00 CST 2002
- MICRON TECHNOLOGY INC
An interconnect for testing semiconductor components includes a substrate, and interconnect contacts on the substrate for electrically engaging terminal contacts on the components. The interconnect also includes one or more cavities in the substrate which form...
US4297637 (A), filed
Thu Jul 20 00:00:00 CDT 1978
, published
Tue Oct 27 00:00:00 CST 1981
- UNIV CALIFORNIA
Densities of resonant nuclei within elemental volumes along a line are measured using the nuclear magnetic resonance phenomenon called "spin echo." A first planar volume of nuclei is selectively excited to nutate spins by approximately 90 DEG . Thereafter a...
US6600359 (B1), filed
Wed Nov 03 00:00:00 CST 1999
, published
Tue Jul 29 00:00:00 CDT 2003
- MICRON TECHNOLOGY INC
An integrated device includes a redundant bond pad for accessing internal circuitry in the event that the main bond pad for that circuitry is difficult to access with testing equipment. Signals from the redundant bond pad are biased to ground during normal...
US4873459 (A), filed
Wed May 18 00:00:00 CDT 1988
, published
Tue Oct 10 00:00:00 CDT 1989
- ACTEL CORP
A user-programmable interconnect architecture, which may be used for logic arrays for digital and analog system design, is disclosed. In one embodiment, a plurality of logic cells or modules in a matrix are connected by vertical and horizontal wiring channels....
US4873459 (B1), filed
Wed May 18 00:00:00 CDT 1988
, published
Tue Jan 10 00:00:00 CST 1995
- ACTEL CORP
US4761768 (A), filed
Mon Mar 04 00:00:00 CST 1985
, published
Tue Aug 02 00:00:00 CDT 1988
- LATTICE SEMICONDUCTOR CORP
An improved programmable logic device (PLD) is disclosed which employs electrically erasable memory cells which can be programmed and erased at high speed. The PLD memory cells comprise floating gate transistors as the storage elements, which are programmed...
US4908568 (A), filed
Thu Apr 28 00:00:00 CDT 1988
, published
Tue Mar 13 00:00:00 CST 1990
- SIEMENS AG
A mechanical probe for optical measurement of electrical potentials. The probe of the present invention is composed of a cubic, electro-optical crystal fashioned in the form of a tip and of a metallization which is at ground potential and which covers the...
US5406566 (A), filed
Fri Oct 22 00:00:00 CDT 1993
, published
Tue Apr 11 00:00:00 CDT 1995
- NIPPON ELECTRIC CO
A dynamic random access memory device is subjected to a diagnosis upon completion of fabrication to see whether or not a defective memory cell is incorporated in memory cell sub-arrays, one of the input/output data buffer circuits incorporated therein...
US6889072 (B2), filed
Thu Jul 05 00:00:00 CDT 2001
, published
Tue May 03 00:00:00 CDT 2005
The present invention is a method and apparatus for providing preferential enhancement of an artery of interest relative to adjacent veins and background tissue. The method and apparatus adapts the timing of a maximum or substantially elevated rate of infusion...
US6983536 (B2), filed
Tue May 18 00:00:00 CDT 2004
, published
Tue Jan 10 00:00:00 CST 2006
- MICRON TECHNOLOGY INC
A method and apparatus for fabricating known good semiconductor dice are provided. The method includes the steps of: testing the gross functionality of dice contained on a semiconductor wafer; sawing the wafer to singulate a die; and then testing the die by...
US5825195 (A), filed
Mon Oct 30 00:00:00 CST 1995
, published
Tue Oct 20 00:00:00 CDT 1998
- MICRON TECHNOLOGY INC
Optical alignment techniques, such as those used in "flip chip" bonding, are used to establish ohmic contact with the die by means of raised portions on contact members. This permits accurate alignment with a temporary die fixture in order to test the die. The...
US5390191 (A), filed
Thu Jan 21 00:00:00 CST 1993
, published
Tue Feb 14 00:00:00 CST 1995
- SONY CORP
An integrated circuit for boundary scan is achieved to be simple structure. A testing apparatus 6 provides a testing data to a serial input port SI of a integrated circuit IC1 via a external terminal unit 2. The testing data is output to a parallel input port...
US6864201 (B2), filed
Wed Jun 13 00:00:00 CDT 2001
, published
Tue Mar 08 00:00:00 CST 2005
- SYMYX TECHNOLOGIES INC
Methods and apparatus for the preparation and use of a substrate having an array of diverse materials in predefined regions thereon. A substrate having an array of diverse materials thereon is generally prepared by delivering components of materials to...
US5083083 (A), filed
Wed Jul 05 00:00:00 CDT 1989
, published
Tue Jan 21 00:00:00 CST 1992
- ACTEL CORP
In a user-configurable integrated circuit including a plurality of uncommitted conductors which may be programmably connected to one another and to functional circuit blocks by a user to form electronic circuits, apparatus for testing for defects in the form...
US6407546 (B1), filed
Fri Apr 07 00:00:00 CDT 2000
, published
Tue Jun 18 00:00:00 CDT 2002
A method and system for identifying thicknesses of inspection samples, such as semiconductor wafers is presented. The method and system includes a probe housing, comprising an eddy current sense coil and a linear motion controller, and a computer that controls...
US7019519 (B2), filed
Tue Aug 24 00:00:00 CDT 2004
, published
Tue Mar 28 00:00:00 CST 2006
- LE CUONG DUY
A method for monitoring an inspection sample includes generating inspection data comprising resistance and reactance measurements that are obtained from an inspection sample having a conductive layer of unknown thickness. Calibration data is used for...
US5268852 (A), filed
Fri Oct 25 00:00:00 CDT 1991
, published
Tue Dec 07 00:00:00 CST 1993
- ROSEMOUNT ANALYTICAL INC
An apparatus and method for measuring potentiometric electrode impedance for diagnostic purpose while continuously reading the results of the process value. A square wave is applied to an external circuit, which in turn is coupled to an electrode assembly...
US4864512 (A), filed
Wed Aug 20 00:00:00 CDT 1986
, published
Tue Sep 05 00:00:00 CDT 1989
- FLUKE MFG CO JOHN
A measuring device includes a microprocessor controller programmed for performing any of a plurality of mathematical functions on a measured value of a parameter under test. The measuring device is provided with two displays, for displaying to a user both the...
US6353563 (B1), filed
Mon Mar 15 00:00:00 CST 1999
, published
Tue Mar 05 00:00:00 CST 2002
- TEXAS INSTRUMENTS INC
An integrated circuit has a built-in self-test (BIST) arrangement (60). The built-in self-test arrangement includes a read only memory (ROM), (140) that stores test algorithm instructions. A ROM logic circuit (410) receives an instruction read from the read...
US4709202 (A), filed
Thu Jun 19 00:00:00 CDT 1986
, published
Tue Nov 24 00:00:00 CST 1987
- NORAND CORP
In an exemplary embodiment, a battery conditioning system monitors battery conditioning and includes a memory for storing data based thereon; for example, data may be stored representative of available battery capacity as measured during a deep discharge...
US7098055 (B2), filed
Thu Oct 06 00:00:00 CDT 2005
, published
Tue Aug 29 00:00:00 CDT 2006
- HITACHI HIGH TECH CORP
A defect inspection method includes radiating an illumination slit-shaped beam having lights substantially parallel to a longitudinal direction to a substrate having circuit patterns in a direction inclined at a predetermined gradient relative to the direction...
US5883843 (A), filed
Wed Apr 30 00:00:00 CDT 1997
, published
Tue Mar 16 00:00:00 CST 1999
- TEXAS INSTRUMENTS INC
An integrated circuit has a built-in self-test (BIST) arrangement (60). The built-in self-test arrangement includes a read only memory (ROM), (140) that stores test algorithm instructions. A ROM logic circuit (410) receives an instruction read from the read...
US5015885 (A), filed
Fri Feb 10 00:00:00 CST 1989
, published
Tue May 14 00:00:00 CDT 1991
- ACTEL CORP
A user-programmable interconnect architecture, which may be used for logic arrays for digital and analog system design, is disclosed. In one embodiment, a plurality of logic cells or modules in a matrix are connected by vertical and horizontal wiring channels....
US6310590 (B1), filed
Wed Aug 11 00:00:00 CDT 1999
, published
Tue Oct 30 00:00:00 CST 2001
- TEXAS DIGITAL SYSTEMS INC
A method for continuously controlling color of a display device comprises the steps of receiving three sets of data respectively representing the portions of three primary colors, accumulating three counts in accordance with the data, respectively, and setting...
US6182247 (B1), filed
Mon Oct 27 00:00:00 CST 1997
, published
Tue Jan 30 00:00:00 CST 2001
- ALTERA CORP
A technique for embedding a logic analyzer in a programmable logic device allows debugging of such a device in its actual operating conditions. A logic analyzer circuit is embedded within a PLD, it captures and stores logic signals, and it unloads these...
US5734863 (A), filed
Wed Aug 17 00:00:00 CDT 1994
, published
Tue Mar 31 00:00:00 CST 1998
- NAT INSTR CORP
A type definition ability in a graphical programming environment which enables a user to assign a name to a custom control that the user intends to use throughout one or more virtual instruments. The user can create a master or original of a control and use...
US6704895 (B1), filed
Mon Nov 01 00:00:00 CST 1999
, published
Tue Mar 09 00:00:00 CST 2004
- TEXAS INSTRUMENTS INC
An emulation device including a serial scan testability interface having at least first and second scan paths, and state machine circuitry connected and responsive to said second scan path generally operable for emulation control.
US6697659 (B1), filed
Fri Jul 17 00:00:00 CDT 1998
, published
Tue Feb 24 00:00:00 CST 2004
- BONUTTI 2003 TRUST A
An apparatus and method for use in medical imaging simulate within an imaging coil normal movements of body parts such as joints, and improve imaging of soft tissue and bony parts as compared to a static system in which images are taken of a joint in only one...
US7161175 (B2), filed
Fri Jan 21 00:00:00 CST 2005
, published
Tue Jan 09 00:00:00 CST 2007
- SHAU JENG-JYE
The present invention discloses novel methods to transfer data between a plurality of integrated circuit dice on a semiconductor wafer. Each individual die contains internal circuits to control data transfer to nearby dice. Wafer level data transfer is...
US6670819 (B2), filed
Thu Jan 24 00:00:00 CST 2002
, published
Tue Dec 30 00:00:00 CST 2003
- MICRON TECHNOLOGY INC
A method of engaging electrically conductive test pads on a semiconductor substrate having integrated circuitry for operability testing thereof includes: a) providing an engagement probe having an outer surface comprising a grouping of a plurality of...
US4732043 (A), filed
Mon Aug 11 00:00:00 CDT 1986
, published
Tue Mar 22 00:00:00 CST 1988
- BELL MICROSENSORS INC
A method and apparatus are disclosed for deriving digital signals from analog variations of different sensing elements in a transducer. Each sensing device controls the frequency of a variable frequency oscillator, which is energized when a reading is to be...
US5222030 (A), filed
Fri Apr 06 00:00:00 CDT 1990
, published
Tue Jun 22 00:00:00 CDT 1993
- LSI LOGIC CORP
US4854710 (A), filed
Thu Jul 23 00:00:00 CDT 1987
, published
Tue Aug 08 00:00:00 CDT 1989
- THERMA WAVE INC
A method and apparatus are disclosed for evaluating surface and subsurface features in a semiconductor sample. In operation, a periodic energy source is applied to the surface of the semiconductor sample to generate a periodic electron-hole plasma. This plasma...
USRE36325 (E), filed
Tue Sep 26 00:00:00 CDT 1995
, published
Tue Oct 05 00:00:00 CDT 1999
- MICRON TECHNOLOGY INC
A leadframe interconnect package is tape automated bond (TAB) bonded to circuitry on the chip and which provides a circuit connection for subsequent connection to a printed circuit board. The encapsulated chips will replace both the leadframe and printed...
US5541525 (A), filed
Mon Nov 14 00:00:00 CST 1994
, published
Tue Jul 30 00:00:00 CDT 1996
- MICRON TECHNOLOGY INC
A carrier for testing an unpackaged semiconductor die is provided. The carrier includes: a base; a temporary interconnect for establishing electrical communication between the die and external test circuitry; a retention mechanism for securing the interconnect...
US6496940 (B1), filed
Wed Jun 07 00:00:00 CDT 1995
, published
Tue Dec 17 00:00:00 CST 2002
- COMPAQ COMPUTER CORP
A multiprocessor system includes a number of sub-processor systems, each substantially identically constructed, and each comprising a central processing unit (CPU), and at least one I/O device, interconnected by routing apparatus that also interconnects the...
US5097492 (A), filed
Mon Feb 12 00:00:00 CST 1990
, published
Tue Mar 17 00:00:00 CST 1992
- FOUR PI SYSTEMS CORP
A tomographic inspection system wherein the electron beam of a microfocus X-ray tube is deflected in a circular scan pattern onto the tube anode in synchronization with a rotating detector that converts the X-ray shadowgraph into an optical image and derotates...
US5985356 (A), filed
Tue Oct 18 00:00:00 CDT 1994
, published
Tue Nov 16 00:00:00 CST 1999
- SYMYX TECHNOLOGIES INC
Methods and apparatus for the preparation and use of a substrate having an array of diverse materials in predefined regions thereon. A substrate having an array of diverse materials thereon is generally prepared by delivering components of materials to...
USRE37740 (E1), filed
Tue Jan 17 00:00:00 CST 1995
, published
Tue Jun 11 00:00:00 CDT 2002
- KLA TENCOR CORP
Substrate inspection apparatus and methods, and illumination apparatus. The inspection apparatus and method includes memory for storing the desired features of the surface of the substrate, focussed illuminator for substantially uniformly illuminating a region...
US4746991 (A), filed
Tue Jan 12 00:00:00 CST 1982
, published
Tue May 24 00:00:00 CDT 1988
- DISCOVISION ASS
US4240149 (A), filed
Fri Feb 16 00:00:00 CST 1979
, published
Tue Dec 16 00:00:00 CST 1980
- LEEDS NORTHRUP
There is provided a method for measuring a parameter whose value is calculable as an integral with time of a function of at least one variable so as to make possible the use of a microprocessor when measurements of such variables are desired. The variable is...
US5905382 (A), filed
Mon May 06 00:00:00 CDT 1996
, published
Tue May 18 00:00:00 CDT 1999
- MICRON TECHNOLOGY INC
A reusable burn-in/test fixture for testing unsingulated dice on a semiconductor wafer consisting of two halves. The first half of the test fixture is a die cavity plate for receiving the wafer, and the second half establishes electrical communication between...
US4827945 (A), filed
Fri Jun 26 00:00:00 CDT 1987
, published
Tue May 09 00:00:00 CDT 1989
- ADVANCED MAGNETICS INC
This invention relates to materials exhibiting certain magnetic and biological properties which make them uniquely suitable for use as magnetic resonance imaging (MRI) agents to enhance MR images of animal organs and tissues. More particularly, the invention...
US6913468 (B2), filed
Fri Oct 10 00:00:00 CDT 2003
, published
Tue Jul 05 00:00:00 CDT 2005
- FORMFACTOR INC
Surface-mount, solder-down sockets are described which permit electronic components such as semiconductor packages to be releasably mounted to a circuit board. Generally, the socket includes resilient contact structures extending from a top surface of a...
US5712566 (A), filed
Fri Feb 23 00:00:00 CST 1996
, published
Tue Jan 27 00:00:00 CST 1998
- WESTERN ATLAS INT INC
A nuclear magnetic resonance apparatus including a magnet generating a static magnetic field in a first region containing materials to be analyzed. The magnet generates zero static magnetic field in a second region. The magnet has generally homogeneous...
US6690343 (B2), filed
Tue Mar 20 00:00:00 CST 2001
, published
Tue Feb 10 00:00:00 CST 2004
- TEXAS DIGITAL SYSTEMS INC
A method for automatically evaluating the displayed value comprises the steps of receiving data for display, exhibiting a display indication of the data on a light emitting diode display area substantially surrounded by a variable color background area,...
US5737622 (A), filed
Wed Sep 22 00:00:00 CDT 1993
, published
Tue Apr 07 00:00:00 CDT 1998
- NAT INSTR CORP
An occurrence capability which allows a first function to "go to sleep" while waiting for a second function to produce a result. In this manner, the first function does not consume any CPU time while waiting for the second function. Three icons are provided...
US6181126 (B1), filed
Thu Jun 17 00:00:00 CDT 1999
, published
Tue Jan 30 00:00:00 CST 2001
- TEXAS DIGITAL SYSTEMS INC
A measuring system performs measurement of two measured values and simultaneously exhibits the two measurement results in a digital format on a single variable color display device in respectively different colors, in order to distinguish them comfortably.
US7047059 (B2), filed
Tue Mar 27 00:00:00 CST 2001
, published
Tue May 16 00:00:00 CDT 2006
- QUANTUM MAGNETICS INC
A probe instrument using room-temperature sensor(s) that can measure variations in magnetic susceptibilities. The instrument has sufficient resolution to monitor paramagnetic materials in a human body, such as iron in a human liver, by noninvasively examining...
US6424327 (B2), filed
Wed Aug 11 00:00:00 CDT 1999
, published
Tue Jul 23 00:00:00 CDT 2002
- TEXAS DIGITAL SYSTEMS INC
A multicolor display element includes a plurality of display areas arranged in a pattern, each including light emitting diodes of respective primary colors, which are coupled to the buses in accordance with their colors. A single enable input is provided for...
US6882877 (B2), filed
Thu Sep 18 00:00:00 CDT 2003
, published
Tue Apr 19 00:00:00 CDT 2005
- BONUTTI RES INC
The present invention relates to a magnetic resonance imaging system that includes a stationary electromagnet, a patient support for maintaining a patient in a standing or seated position, and an actuator for raising and lowering the patient relative to a...
US4721913 (A), filed
Fri Aug 15 00:00:00 CDT 1986
, published
Tue Jan 26 00:00:00 CST 1988
- MCW RES FOUND INC
Counter Rotating Current (CRC) pairs of loop-gap resonators are combined with planar pairs of loop-gap resonators to form networks of NMR local coils. A first embodiment is a quadrature probe in which a planar pair is sandwiched between the loop-gap resonators...
US6091254 (A), filed
Mon Dec 14 00:00:00 CST 1998
, published
Tue Jul 18 00:00:00 CDT 2000
- MICRON TECHNOLOGY INC
A reusable burn-in/test fixture for testing unsingulated dice on a semiconductor wafer consists of two halves. The first half of the test fixture is a wafer cavity plate for receiving the wafer, and the second half establishes electrical communication between...
US6751562 (B1), filed
Thu Mar 22 00:00:00 CST 2001
, published
Tue Jun 15 00:00:00 CDT 2004
- POWER MEASUREMENT LTD
A power management architecture for an electrical power distribution system, or portion thereof, is disclosed. The architecture includes multiple intelligent electronic devices ("IED's") distributed throughout the power distribution system to manage the flow...
US7084656 (B1), filed
Mon Oct 21 00:00:00 CDT 1996
, published
Tue Aug 01 00:00:00 CDT 2006
- FORMFACTOR INC
An interconnection contact structure assembly including an electronic component having a surface and a conductive contact carried by the electronic component and accessible at the surface. The contact structure includes an internal flexible elongate member...
US6728113 (B1), filed
Thu Jun 24 00:00:00 CDT 1993
, published
Tue Apr 27 00:00:00 CDT 2004
- POLYCHIP INC
Apparatus is described for capacitively signalling between different semiconductor chips and modules without the use of connectors, solder bumps, wire-bond interconnections or the like. Preferably, pairs of half-capacitor plates, one half located on each chip,...
US5578526 (A), filed
Mon May 01 00:00:00 CDT 1995
, published
Tue Nov 26 00:00:00 CST 1996
- MICRON TECHNOLOGY INC
A method for forming a multi chip module for singulated semiconductor dice or dice contained on a wafer is provided. The method includes forming an interconnect adapted to support and establish an electrical connection with the dice. The interconnect includes...
US6545498 (B2), filed
Wed Mar 28 00:00:00 CST 2001
, published
Tue Apr 08 00:00:00 CDT 2003
- MICRON TECHNOLOGY INC
Flip-chip semiconductor assemblies, each including integrated circuit (IC) dice and an associated substrate, are electrically tested before encapsulation using an in-line or in-situ test socket or probes at a die-attach station. Those assemblies using "wet"...
US6551845 (B1), filed
Tue Jan 02 00:00:00 CST 1996
, published
Tue Apr 22 00:00:00 CDT 2003
- MICRON TECHNOLOGY INC
A method of using adhesive tape to temporarily retain a die being temporarily held in a fixture during testing and burn-in. The method of the present invention uses a die cut piece of adhesively coated tape to hold a die in a test and burn-in fixture. Upon...
US6657450 (B2), filed
Fri Oct 01 00:00:00 CDT 1999
, published
Tue Dec 02 00:00:00 CST 2003
- MICRON TECHNOLOGY INC
A method of engaging electrically conductive test pads on a semiconductor substrate having integrated circuitry for operability testing thereof includes: a) providing an engagement probe having an outer surface comprising a grouping of a plurality of...
US4589815 (A), filed
Thu Aug 11 00:00:00 CDT 1983
, published
Tue May 20 00:00:00 CDT 1986
- INTEST CORP
A system for positioning an electronic test head of a test system with respect to an electronic device handler. A positioner assembly moves vertically and provides substantial movement in the horizontal plane with six degrees of freedom. The positioner...
US4589815 (B1), filed
Thu Aug 11 00:00:00 CDT 1983
, published
Tue Apr 07 00:00:00 CDT 1998
- INTEST CORP
US6546505 (B1), filed
Thu Jul 01 00:00:00 CDT 1999
, published
Tue Apr 08 00:00:00 CDT 2003
- TEXAS INSTRUMENTS INC
A data processing device including a semiconductor chip, an electronic processor on-chip and an on-chip condition sensor connected to the electronic processor for analysis of the operations.
US4901221 (A), filed
Mon Apr 14 00:00:00 CST 1986
, published
Tue Feb 13 00:00:00 CST 1990
- NAT INSTR CORP
A method for programming a computer system having a display console for displaying images to control at least one of a virtual instrument and an instrument by the steps of displaying on the screen at least one first function-icon that references at least one...
System for simultaneous, interactive presentation of electronic circuit diagrams and simulation data
US5220512 (A), filed
Mon Jul 20 00:00:00 CDT 1992
, published
Tue Jun 15 00:00:00 CDT 1993
- LSI LOGIC CORP
A system for interactive, design and stimulation of an electronic circuit allowing a user to design a circuit by graphical entry and to view full or partial simulation and design results, simultaneously, on a single display window. The user is able to define...
US5964835 (A), filed
Wed Jun 07 00:00:00 CDT 1995
, published
Tue Oct 12 00:00:00 CDT 1999
- TANDEM COMPUTERS INC
A multiprocessor system includes a number of central processing unit (CPUs) and at least one input/output (I/O) device interconnected by routing apparatus for communicating packetized messages therebetween. The messages contain address information identifying...
US6686758 (B1), filed
Thu Mar 23 00:00:00 CST 2000
, published
Tue Feb 03 00:00:00 CST 2004
- MICRON TECHNOLOGY INC
A method of engaging electrically conductive test pads on a semiconductor substrate having integrated circuitry for operability testing thereof includes: a) providing an engagement probe having an outer surface comprising a grouping of a plurality of...
US4933638 (A), filed
Mon Jun 19 00:00:00 CDT 1989
, published
Tue Jun 12 00:00:00 CDT 1990
- SCHLUMBER TECHNOLOGY CORP
Borehole NMR logging apparatus and methods, and methods for the interpretation thereof. A logging tool is provided which produces a strong, static and homogeneous magnetic field B0 in a Volume of an adjacent formation on one side of the tool to measure nuclear...
US6492822 (B2), filed
Tue Oct 30 00:00:00 CST 2001
, published
Tue Dec 10 00:00:00 CST 2002
- CASCADE MICROTECH INC
A probe station includes a fully guarded chuck assembly and connector mechanism for increasing sensitivity to low-level currents while reducing settling times. The chuck assembly includes a wafer-supporting first chuck element surrounded by a second chuck...
US7078926 (B2), filed
Mon Aug 23 00:00:00 CDT 2004
, published
Tue Jul 18 00:00:00 CDT 2006
- FORMFACTOR INC
Techniques for performing wafer-level burn-in and test of semiconductor devices include a test substrate having active electronic components such as ASICs mounted to an interconnection substrate or incorporated therein, metallic spring contact elements...
US5914953 (A), filed
Wed Jun 07 00:00:00 CDT 1995
, published
Tue Jun 22 00:00:00 CDT 1999
- TANDEM COMPUTERS INC
A processing system includes multiple processor units and multiple input/output elements communicatively interconnected by a system area network having a plurality of multi-ported router elements. Communication between the system elements uses message packets...
US6414506 (B2), filed
Thu Dec 17 00:00:00 CST 1998
, published
Tue Jul 02 00:00:00 CDT 2002
- MICRON TECHNOLOGY INC
A method for testing unpackaged semiconductor dice having raised contact locations (e.g., bumped bond pads) and a method for forming an interconnect suitable for testing this type of dice are provided. The interconnect includes a substrate having contact...
US6759870 (B2), filed
Thu Feb 20 00:00:00 CST 2003
, published
Tue Jul 06 00:00:00 CDT 2004
- ALTERA CORP
A programmable logic array integrated circuit has a number of programmable logic modules which are grouped together in a plurality of logic array blocks ("LABs"). The LABs are arranged on the circuit in a two dimensional array. A conductor network is provided...
US5523697 (A), filed
Fri Mar 04 00:00:00 CST 1994
, published
Tue Jun 04 00:00:00 CDT 1996
- MICRON TECHNOLOGY INC
A method of engaging electrically conductive test pads on a semiconductor substrate having integrated circuitry for operability testing thereof includes: a) providing an engagement probe having an outer surface comprising a grouping of a plurality of...
US4992850 (A), filed
Wed Feb 15 00:00:00 CST 1989
, published
Tue Feb 12 00:00:00 CST 1991
- MICRON TECHNOLOGY INC
A leadframe interconnect package is tape automated bond (TAB) bonded to circuitry on the chip and which provides a circuit connection for subsequent connection to a printed circuit board. The encapsulated chips will replace both the leadframe and printed...
US7368678 (B2), filed
Tue Aug 13 00:00:00 CDT 2002
, published
Tue May 06 00:00:00 CDT 2008
- MICRON TECHNOLOGY INC
A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, including automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with...
US6380754 (B1), filed
Fri Mar 12 00:00:00 CST 1999
, published
Tue Apr 30 00:00:00 CDT 2002
- MICRON TECHNOLOGY INC
A method of engaging electrically conductive test pads on a semiconductor substrate having integrated circuitry for operability testing thereof includes: a) providing an engagement probe having an outer surface comprising a grouping of a plurality of...
US5233191 (A), filed
Tue Apr 02 00:00:00 CST 1991
, published
Tue Aug 03 00:00:00 CDT 1993
- HITACHI LTD
Method and apparatus of detecting, analyzing and evaluating the content of foreign matters such as dusts and impurities contained in various materials, units, processes and environment standing for constituting components of a mass production line during mass...
US5931685 (A), filed
Mon Jun 02 00:00:00 CDT 1997
, published
Tue Aug 03 00:00:00 CDT 1999
- MICRON TECHNOLOGY INC
An interconnect and system for establishing temporary electrical communication with semiconductor components having contact bumps are provided. The interconnect includes a substrate with patterns of contact members adapted to electrically contact the contact...
US4209852 (A), filed
Mon Nov 11 00:00:00 CST 1974
, published
Tue Jun 24 00:00:00 CDT 1980
- HYATT GILBERT P
An improved arrangement is provided for processing analog and digital signals, where particular advantages are obtained using charge coupled devices (CCDs). A memory arrangement utilizes a novel refresh circuit to re-establish signal amplitudes which are...
US4877326 (A), filed
Fri Feb 19 00:00:00 CST 1988
, published
Tue Oct 31 00:00:00 CST 1989
- KLA INSTR CORP
Substrate inspection apparatus and methods, and illumination apparatus. The inspection apparatus and method includes memory for storing the desired features of the surface of the substrate, focussed illuminator for substantially uniformly illuminating a region...
US6559668 (B1), filed
Mon Jan 24 00:00:00 CST 2000
, published
Tue May 06 00:00:00 CDT 2003
- CASCADE MICROTECH INC
A low-current pogo probe card for measuring currents down to the femtoamp region includes a laminate board having a layer of conductive traces interposed between two dielectric layers. A plurality of probing devices, such as ceramic blades, are edge-mounted...
US5196833 (A), filed
Tue Aug 13 00:00:00 CDT 1991
, published
Tue Mar 23 00:00:00 CST 1993
- FORD MOTOR CO
A low voltage detection circuit includes bandgap and differential comparator circuits for generating a first signal proportional to the level of the supply voltage when it exceeds a predetermined range, and an output driver responsive to the first signal for...
US6734837 (B1), filed
Wed Jun 16 00:00:00 CDT 1999
, published
Tue May 11 00:00:00 CDT 2004
- TEXAS DIGITAL SYSTEMS INC
A variable color optical device repeatedly develops a start signal and two end signals respectively timed in relation to the start signal in accordance with the values of two sets of data. Two stable signals are developed, each from the start signal to the...
US6087845 (A), filed
Wed Nov 04 00:00:00 CST 1998
, published
Tue Jul 11 00:00:00 CDT 2000
- MICRON TECHNOLOGY INC
A reusable burn-in/test fixture for testing unsingulated dice on a semiconductor wafer consists of two halves. The first half of the test fixture is a wafer cavity plate for receiving the wafer, and the second half establishes electrical communication between...
US6477200 (B1), filed
Tue Nov 09 00:00:00 CST 1999
, published
Tue Nov 05 00:00:00 CST 2002
- BROADCOM CORP
Various systems and methods providing high speed decoding, enhanced power reduction and clock domain partitioning for a multi-pair gigabit Ethernet transceiver are disclosed. ISI compensation is partitioned into two stages; a first stage compensates ISI...
US4441075 (A), filed
Thu Jul 02 00:00:00 CDT 1981
, published
Tue Apr 03 00:00:00 CST 1984
- IBM
Design rules and test structure are used to implement machine designs to thereby obviate during testing the need for mechanical probing of the chip, multichip module, card or board at a higher level of package. The design rules and test structure also provide...
US6549006 (B2), filed
Tue Apr 17 00:00:00 CDT 2001
, published
Tue Apr 15 00:00:00 CDT 2003
A method for identifying metal layer thickness of an inspection sample according to one embodiment utilizes an eddy current probe to obtain initial resistance and reactance measurements from the inspection sample. Once these measurements have been obtained,...
US4258317 (A), filed
Thu Apr 12 00:00:00 CST 1979
, published
Tue Mar 24 00:00:00 CST 1981
- LEWIS ENGINEERING COMPANY
An electrical indicator device for providing simultaneous relatively coarse analog, and higher-resolution, digital readings of a particular electrical parameter, all in one instrument. The device includes a d'Arsonval meter movement which carries a pointer...
US4800378 (A), filed
Fri Aug 23 00:00:00 CDT 1985
, published
Tue Jan 24 00:00:00 CST 1989
- SNAP ON TOOLS CORP
US5675807 (A), filed
Wed Jun 07 00:00:00 CDT 1995
, published
Tue Oct 07 00:00:00 CDT 1997
- TANDEM COMPUTERS INC
A multiprocessor system includes a number of sub-processor systems, each substantially identically constructed, and each comprising a central processing unit (CPU), and at least one I/O device, interconnected by routing apparatus that also interconnects the...
USRE40188 (E1), filed
Thu Dec 12 00:00:00 CST 2002
, published
Tue Mar 25 00:00:00 CDT 2008
- ICID LLC
An integrated circuit identification device (ICID) to be incorporated into an integrated circuit (IC) includes an array of electronic cells in which the magnitude of an output signal of each cell is a function of randomly occurring parametric variations which...
US6201394 (B1), filed
Fri Nov 21 00:00:00 CST 1997
, published
Tue Mar 13 00:00:00 CST 2001
- FONAR CORP
A magnet for magnetic resonance imaging has an interior working space within the magnet frame sufficient to accommodate a physician and a patient. Because the physician is positioned inside the magnet frame, the physician has unimpeded access to the patient....
