- Patent JP2768175(B2)

Filed: Oct 26, 1992

Published: Jun 25, 1998

Application Number

4287229

Priority Claims

JP28722992

Family Members

JP6139798(A) - SEMICONDUCTOR MEMORY

US5406566(A) - Semiconductor memory device having diagnostic circuit for comparing multi-bit read-out test data signal with multi-bit write-in test data signal stored in serial-input shift register

JP2768175(B2) -

Classification Codes

G11C29/38, G11C29/00, G11C29/34, G11C29/04, G11C29/32, G01R31/28

- Patent JP2768175(B2)

Application Number

Priority Claims

Family Members

Classification Codes

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