Measuring system - Patent US4240149(A)
Filed:
Feb 16, 1979
Published:
Dec 16, 1980
Abstract
There is provided a method for measuring a parameter whose value is calculable as an integral with time of a function of at least one variable so as to make possible the use of a microprocessor when measurements of such variables are desired. The variable is sampled periodically at a frequency asynchronous with the wave form which the variable follows and then there is periodically calculated the value of the function by summing the values for the function determined by the samples taken during the time between the calculations, thus determining the desired integral.Applicants
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LEEDS NORTHRUP
Inventors
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FLETCHER DAVID L
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STADLIN WALTER O
Application Number
012632Priority Claims
US1263279Family Members
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